Rotated Wedge Averaging Method for Junction Characterization

The computational cost of conventional lter methods for junction characterization is very high. This burden can be attenuated by using steerable lters. However, in order to achieve a high orientational selectivity to characterize complex junctions a large number of basis lters is necessary. From this results a yet too high computational eeort for steerable lters. In this paper we present a new method for characterizing junctions which keeps the high orientational resolution and is computationally eecient. It is based on applying rotated copies of a wedge averaging lter and estimating the derivative with respect to the polar angle. The new method is compared with the steerable wedge lter method 13] in experiments with real images. We show the superiority of our method as well as its adaptability to scale changes and robustness against noise.